Front-End Semiconductor

Proven and Adopted

• Major Semi fabs WW have adopted CYBE wireless measurement devices
• Adopted as the Best Known Method (BKM)

Most Efficient & Effective

• Travels anywhere a wafer or reticle travels
• Calibrations can be done under closed chamber processes
• Provides accurate, reliable and repeatable real-time data that saves time and expense compared to legacy methods

Save Time & Expense

• Improves yields and tool uptime
• Increases throughput
• Reduces resource needs
• Speeds equipment set-up, maintenance processes, trouble-shooting, qualification and release to production.
• Speeds tool optimization, stabilization and standardization.
• Streamlines fab processesEstablishes repeatable and verifiable standards