Automated Optical Inspection and Metrology System
We are honored to have earned the 2024 Prime Award! This is the top award at the Step-by-Step Excellence Awards, for our SQ3000M2 Automated Optical Inspection (AOI) and Metrology System.
Our newly released SQ3000M2 Inspection and Metrology System, provides superior performance, tailored for microelectronic applications. This system offers unmatched accuracy and resolution. Building on the industry-leading SQ3000 platform, the SQ3000M2 enhances yields, processes, and overall productivity.
Solutions for Back-End Semiconductor Applications
Ultimate Combination of High Speed, High Accuracy and High Resolution
Test & Inspection News
Keep up to date with the latest news from Nordson Test & Inspection, including new product launches and press releases.
Nordson Test & Inspection Wins 2025 Mexico Technology Award for Industry-Leading MXI Solution
Minneapolis, Minnesota — September 2025 – Nordson Test & Inspection is proud to announce that it has been awarded a...
Read More Nordson Test & Inspection Wins 2025 Mexico Technology Award for Industry-Leading MXI SolutionNordson Test & Inspection Expands Partnership with Distributor smartTec Nordic A/S
Nordson Test & Inspection Expands Partnership with Distributor smartTec Nordic A/S Minneapolis, Minnesota — July 10,...
Read More Nordson Test & Inspection Expands Partnership with Distributor smartTec Nordic A/SAward Winning Acquisition Mode Dynamic Planar CT
Nordson Test & Inspection's new Dynamic Planar CT™ was recently recognized for it's superior software package for...
Read More Award Winning Acquisition Mode Dynamic Planar CTNordson Test & Inspection Receives Top Honor with Prime Step-by-Step Innovation Award for SQ3000M2 System
Minneapolis, Minnesota — November 12, 2024 — Nordson Test & Inspection today announced that it has earned the Prime...
Read More Nordson Test & Inspection Receives Top Honor with Prime Step-by-Step Innovation Award for SQ3000M2 SystemContact Nordson Test & Inspection
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