AMI SpinSAM - Scanning - Acoustic - Microscopy
- Industry leading throughput on four 300mm wafer inspection
- Best in class footprint / UPH
- Leading defect capture and image quality
- Modular design for ease of serviceability
- Fully automated inspection and analysis with factory communication
What If....
... there was a product, that understood the importance of Units Per Hour (UPH) - changing the game.
With a compact footprint, saving You expensive cleanroom space with industry leading throughput for Wafer Inspection and speed. It is able to scan 4 wafers simultanously with an innovative spinning scan method. It has proprietary Transducer technology and creates a complete wafer image without stitching. Easy to handle - the ultimate solution for accurately locating defects in a variety of Wafer applications.