Revolutionizing Semiconductor Quality: The Dynamic Planar CT Advantage
X-Ray inspection has become an essential component in semiconductor manufacturing, with 3D imaging emerging as a critical tool for ensuring product quality and reliability. In a recent discussion with Andrew Mathers, Principal Product Line Manager at Nordson Test and Inspection, we gained valuable insights into how advancements in 3D x-ray imaging are revolutionizing the inspection process in semiconductor and surface mount technology (SMT) manufacturing.
Traditional inspection methods have relied heavily on 2D radiographic imaging, which, while useful, has significant limitations when examining today’s increasingly complex electronic components. As manufacturing requirements become more stringent and quality expectations rise, 3D imaging has emerged as a superior alternative. However, implementing effective 3D imaging for electronic components presents unique challenges that Nordson has addressed with its Dynamic Planar CT technology.
Figure 1: Dynamic Planar CT is more than 2x faster than Planar CT and provides brilliant high resolution result images.
Electronic components like semiconductor wafers and printed circuit boards are inherently flat or planar objects. Traditional 3D imaging techniques using planar CT or laminography often introduce artifacts – distortions in the resulting images that don’t actually exist in the sample. These artifacts make it difficult to distinguish between different layers and to identify defects clearly. Mathers explains that while 3D imaging has been available in electronics for some time, the quality has been difficult to achieve due to these inherent challenges with planar samples.
Dynamic Planar CT, Nordson’s next-generation 3D inspection technology, addresses these challenges through both hardware and software innovations. The system takes a fundamentally different approach to image acquisition, capturing more projections from different angles with a wider field of view and implementing advanced reconstruction algorithms. The result is a much higher quality 3D model that significantly reduces artifacts and provides clearer discrimination between layers (Figure 2). Most impressively, this technology operates at twice the speed of traditional planar CT, enabling much higher throughput – a critical factor in manufacturing environments where inspection can’t become a bottleneck.
FIgure 2: 3D reconstruction of BGA Ball.
One of the key benefits of Dynamic Planar CT is its ability to identify critical defects that might otherwise go undetected. In semiconductor back-end processing and SMT manufacturing lines, the technology excels at detecting voids in ball grid arrays, micro bumps in flip chip devices, and other defects that could compromise product performance. By identifying these issues early in the manufacturing process, manufacturers can pull affected components before further processing, preventing costly failures down the line and ensuring only high-quality products reach the end customer.
Beyond simply identifying defects, the technology supports Quality 4.0 and Industry 4.0 initiatives by providing feedback that can be used to improve manufacturing processes. Rather than just flagging the same defect repeatedly, the system can report back to the manufacturing process in a connected smart factory environment, enabling real-time adjustments that address the root cause of defects. This continuous improvement mechanism helps manufacturers maintain consistent quality while minimizing waste and maximizing efficiency.
Nordson’s automated x-ray inspection (AXI) solutions are designed for high-volume manufacturing environments where speed, resolution, and reliability are paramount. With systems tailored for semiconductor, SMT, power hybrid, and final assembly markets, the company supports a wide range of electronic manufacturing applications. With a global presence in over 35 countries and more than 2,000 AXI systems installed worldwide, Nordson has established itself as a leader in this critical inspection technology.
As electronic components continue to become more complex and compact, the role of advanced inspection technologies like Dynamic Planar CT will only grow more important. Manufacturers who embrace these technologies will be better positioned to deliver high-quality products consistently while maintaining the efficiency needed to remain competitive in today’s fast-paced markets.
Equipamentos de inspeção e metrologia
Nossos equipamentos de inspeção e metrologia são amplamente reconhecidos em todo o mundo. Abaixo, você encontrará algumas de nossas soluções não destrutivas comprovadas e de classe mundial.
AMI SpinSAM – Varredura – Acústica – Microscópica
Produtividade líder do setor na inspeção de quatro wafers de 300 mm Melhor área de ocupação/UPH da categoria Captura de...
Saiba maisSQ7000+TM Multi-Function for 3D AOI, SPI & CMM
O sistema multifuncional SQ7000+ com tecnologia de sensor Multi-Reflection Suppression® (MRS®) oferece alta resolução,...
Saiba maisSérie AXI XS
A inspeção 3D em linha com a plataforma AXI de ultra-alta resolução revela detalhes incríveis para a estratégia de Zero...
Saiba maisMXI QUADRA™ 7 Pro
A série Quadra™ Pro cria imagens incríveis de altíssima resolução. O tubo de raios X Dual Mode NT4 de alto desempenho...
Saiba maisMXI X-Plane
A tecnologia X-Plane oferece alta resolução, alta funcionalidade CT de ampliação em qualquer lugar na placa – sem...
Saiba maisSQ3000M2
Desempenho superior ideal para aplicações de wirebond. A inspeção óptica automatizada (AOI) SQ3000M2 garante que...
Saiba maisWaferSense® Auto Teaching System™ (ATS2)
Registre dados de deslocamento tridimensionais (x, y e z) para ensinar rapidamente posições de transferência de wafer.
Saiba maisAMI Gen7 C-SAM®
A Nova Geração da Tecnologia C-SAM. O microscópio acústico C-SAM mais sofisticado e completo para análises...
Saiba maisWaferSense® Auto Gapping System 2™ (AGS2)
Melhore a uniformidade e o resultado com WaferSense AGS2 sem fio para configurações precisas e repetíveis.
Saiba maisGaranta Contador de Componentes de Raio X - Conte conosco
O material correto, na quantidade correta, na hora certa, no lugar certo. Garanta que sua produção seja tranquila e...
Saiba maisCisalhamento BT 4000HS
O teste de cisalhamento da aderência em alta velocidade oferece uma alternativa viável ao complicado e oneroso teste de...
Saiba maisVálvulas de medição de volume da série 003 | Nordson
A Válvula Medidora de Volume da Série 003 é uma válvula medidora de deslocamento positivo que dispensa automaticamente...
Saiba maisNovidades no Think Tank Blog
Saiba mais sobre as soluções da Nordson Test & Inspection, fique por dentro do setor e se aprofunde em novos sistemas de inspeção e equipamentos de metrologia de ponta.