The SIM (Strobed Inspection Module) is at the core of every CyberOptics’ 2D AOI system. Designed and manufactured exclusively by CyberOptics, the SIM delivers high performance inspection at 110cm²/sec – And, it is absolutely calibration-free.

AI² (Autonomous Image Interpretation) technology in the QX250i ensures ultrafast programming and is capable of getting you from zero to production ready in less than 13 minutes*. Powered by an 80-megapixel sensor, QX250i™ significantly improves solder joint and 01005 inspection performance.

From pre-reflow inspection to post wave and post selective solder inspection, the QX250i provides crisp images for more accurate defect review.
Inspect and check for defects including coplanarity, missing pins/ components, insufficient solder, solder bridge and many more.

The QX600™ is designed with SIM Technology (Strobed Inspection Module) with enhanced illumination – delivering the best 01005 and solder joint inspection performance ever.

With a higher sensor resolution (12 µm), you get to see crisp, perfect quality images for more accurate defect review.

The QX250i™ AOI system offers fast, flexible and high performance inspection for all applications and is ideally suited for pre-reflow and selective solder inspection. The top and bottom high-resolution Strobed Inspection Modules (SIMs) with enhanced illumination provide a single platform for the inspection and defect review process that shortens the production line and drives ~50% productivity improvement.

The QX150i™ AOI system offers high value and high flexibility for all applications and is ideally suited for pre-reflow and selective solder inspection. The Strobed Inspection Module (SIM), the core engine behind QX150i™, enables on-the-fly inspection assuring a fast and smooth process.

The QX150™ is powered by an all-new SIM (Strobed Inspection Module) with enhanced illumination – designed to deliver true, in-line inspection performance. The SIM enables on-the-fly inspection making the QX150™ the fastest tabletop ever at 200 cm²/sec. A higher sensor resolution (12µm) offers superior quality images for more accurate defect review. In addition, as always, the SIM is calibration-free.

QX150™ also offers 100% program compatibility with all QX inline AOI systems