This is Quadra™ 7 Pro

The Quadra Pro 7 MXI system provides superior 3D/2D manual inspection for back-end semiconductor applications.
The new, advanced Onyx® detector technology inside provides a higher resolution, lower noise for superior image
clarity, and faster frame rates. The latest Dual Mode Quadra NT4® tube provides maximum flexibility with two
brightness and resolution modes, allowing users to dynamically switch between, depending on their application needs.