SQ3000M2 Award Winning Optical Inspection System
We are delighted to be honored with a Technology Award for our new SQ3000M2 Inspection and Metrology system. Designed for microelectronics applications, the SQ3000M2 provides superior performance with unparalleled accuracy and resolution. The system is an extension of the best-in-class SQ3000 platform that improves yields, processes and productivity. The award was announced during a recent ceremony at SMTA Guadalajara in Mexico, where the system was first unveiled. The SQ3000M2 Automated Optical Inspection (AOI) system won in the category of Inspection Equipment – AOI Systems. The award was announced during a recent ceremony at SMTA Guadalajara in Mexico, where the new system was first unveiled.
Powered by Focus Variation Metrology (FVM) technology and high resolution telecentric optics, the system provides exceptional defect coverage and measurement capabilities. The sensors provide 2D, 2.5D and 3D options for maximum flexibility and the system is ideal for various wire bond applications, including loop height measurement.
The Mexico Technology Awards acknowledge the latest innovations available in Mexico produced by OEM manufacturing equipment and materials suppliers during the last 12 months. For more information, visit www.mexicoems.com/mta-awards.
SQ3000M2 Inspection and Metrology System
Automated bond wire metrology: Focus Variation Metrology (FVM) technology measures bond wire height for High Resolution Optical 3D Surface Metrology.
Powerful, proprietary lighting: Multi-angle, multi-color programmable LED lighting combined with coax illumination ensures the highest measurement accuracy and maximizes defect detection.
Dynamic Z height correction: Auto Focus and Focus Variation Metrology (FVM) technology for "on the fly" automated bond wire and surface height measurements.
For more information, visit www.nordson.com/testinspect.