3D InCites Podcast with Nordson's Product Manager MXI Chris Rand

3D InCites Podcast Host Francoise von Trapp is interviewing Chris Rand, Product Manager Manual X-ray Inspection:

Achieving Zero Defects in Microelectronics Devices using X-Ray Inspection

This podcast episode dives deep into the world of X-ray inspection and its many uses in today’s high-density 3D heterogeneous integration technologies for semiconductor manufacturing. Françoise von Trapp speaks with subject matter expert, Chris Rand, of Nordson TEST & INSPECTION. 

You’ll learn the basics – how X-ray inspection is used in semiconductor manufacturing and how that has changed over the years. The challenges facing manufacturers as heterogeneous integration schemes become more advanced – with 3D stacking and chiplet architectures are also discussed.

You’ll also learn why achieving zero defects is so important for today’s semiconductor and microelectronics devices and the different strategies for achieving zero defects.  

 Lastly, you’ll learn about some solutions provided by Nordson TEST & INSPECTION to help you execute those zero-defect strategies.

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