Access Confirmation Code White Paper - X-ray Bondtester Reliability Study of BGA Devices - Impact of Interfacial Voiding

Access Confirmation Code White Paper - X-ray Bondtester Reliability Study of BGA Devices - Impact of Interfacial Voiding

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X-ray Bondtester Reliability Study of BGA Devices - Impact of Interfacial Voiding

The impact of voiding on BGA/CSP joint reliability has been discussed actively during the last several years.....