Nordson DAGE

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Electronics - Semiconductor

The Nordson DAGE XM8000 fully automatic wafer inspection system provides a unique solution for inspecting bumps, TSVs, MEMs and other structures on 200, 300 and 450 mm wafers.  Fully automatic wafer handling in accordance with the industry standards as well as clean room integration are part of this flexible system. This unique machine is unmatched in the marketplace in the areas of speed, accuracy, user friendly interface and measurement capabilities.

Nordson DAGE Diamond X-ray inspection systems provide the best solution for manual X-ray inspection for the semiconductor industry.  This is made possible by the unique and highest performance X-ray sources and imaging devices developed by the DAGE R&D group. Nordson DAGE bondtesters are widely used for precision destructive and non-destructive testing of components and assemblies within the semiconductor industry.  The market leading 4000Plus bondtester provides the widest range of test solutions and the best accuracy for both manual and fully automatic applications. The 4800 system is a fully automatic solution for wafer testing applications.  Both systems use the most advanced camera-assist programming techniques that assure easy set-up and extremely accurate execution.   

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Quadra™ 3

Quadra™ 3 High quality X-ray inspection for production applications. Detect a wide range of manufacturing defects including BGA, QFN and IGBT attachment, PTH filling, interfacial voiding, component cracking…

Quadra™ 7

Quadra™ 7 At the cutting edge of X-ray inspection performance, Quadra 7 shows you features and defects as small as 0.1µm, non destructively.

XM8000 Wafer X-ray Metrology Platform

XM8000 Wafer X-ray Metrology Platform The Nordson DAGE XM8000 offers fast automatic X-ray measurement of TSVs, 3D packages, MEMS and wafer bumps for voiding, fill level, overlay and other critical dimensions.

4000Plus Bondtester

4000Plus Bondtester The second generation Nordson DAGE 4000Plus is the most advanced bondtester on the market.  Representing the best-in-class, the 4000Plus bondtester sets the industry standard in bond testing offering…

4000 Optima Bondtester

4000 Optima Bondtester The fastest and most accurate bondtester. The Nordson DAGE 4000 Optima is optimized for fast, accurate and reliable bond testing in the volume manufacturing environment.  The combination of patented…

4000HS High Speed Bondtester

4000HS High Speed Bondtester The Nordson DAGE 4000HS bondtester is based upon the industry standard Nordson DAGE 4000 multi-purpose bondtester platform. The 4000HS has significant differences to the mode of operation for both…

Unique Multi-Function Cartridges

Unique Multi-Function Cartridges Switch Applications in Just Seconds! Nordson DAGE’s thorough understanding of bond testing in the volume manufacturing environment underpins the no-compromise development of industry-unique…

4800 Bondtester

4800 Bondtester The Nordson DAGE 4800 is at the forefront of wafer testing technology catering for the testing of wafers from 200mm up to 450mm. Whilst heralding progression in bond testing technology it’s heritage…


4800 INTEGRA® The Nordson DAGE 4800 INTEGRA® is a complete solution for automated on wafer bond testing.

4000 Multipurpose Bondtester

4000 Multipurpose Bondtester The 4000 bondtester is multipurpose, capable of performing all pull and shear applications. The 4000 bondtester can be configured as a simple wire pull tester and upgraded to provide ball shear, die…

Quadra™ 5

Quadra™ 5 Flexible X-ray inspection down to 0.35µm feature size. Quadra 5™ is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit…

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