Nordson DAGE

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Quadra 3 X-ray System
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15 Nov 2018

Nordson DAGE’s Complete Solution for Automated On-Wafer Bondtesting Recognized with a Global Technology Award

The 4800 is the complete solution for automated on wafer bond testing ensuring virtually operator free testing.

04 May 2018

Quadruple Industry Recognition for Nordson DAGE Test and Inspection systems at Nepcon China 2018

Nordson DAGE 4800 Integra™ Automated Wafer Bondtester and Quadra™ 3 X-ray Inspection system win SMT China Vision and EM Asia Innovation Awards

Featured Products


X-ray Inspection


Wafer Characterization

   Quadra 7 4000Plus Bondtester   XM8000 Wafer



Aerospace Automotive Semiconductor
Aerospace automotive electronics semi conductor

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29-31 Jan 2019


San Diego Convention Centre, CA

Visit Nordson DAGE, MATRIX, SONOSCAN AND YESTECH to see the latest developments in Test and Inspection - Booth 2109