Nordson DAGE

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News

15 Nov 2018

Nordson DAGE’s Complete Solution for Automated On-Wafer Bondtesting Recognized with a Global Technology Award

The 4800 is the complete solution for automated on wafer bond testing ensuring virtually operator free testing.

04 May 2018

Quadruple Industry Recognition for Nordson DAGE Test and Inspection systems at Nepcon China 2018

Nordson DAGE 4800 Integra™ Automated Wafer Bondtester and Quadra™ 3 X-ray Inspection system win SMT China Vision and EM Asia Innovation Awards

Events

29-31 Jan 2019

IPC APEX 2019

San Diego Convention Centre, CA

Visit Nordson DAGE, MATRIX, SONOSCAN AND YESTECH to see the latest developments in Test and Inspection - Booth 2109

5-7 Feb 2019

Southern Manufacturing 2019

Farnborough, UK

Visit our distributor Cupio to learn more about Nordson DAGE's X-ray and AOI systems = Stand E110

20-22 Mar 2019

Semicon China 2019

Shanghai, China

Visit us in Booth No. 3637, N3 to see the latest test and inspection equipment from Nordson DAGE, MATRIX and SONOSCAN