As semiconductor technology evolves, packages are becoming increasingly complex as well as significantly smaller in size. These two aspects represent new challenges for the handling and testing of semiconductors. Nordson DAGE has extensive experience working within the semiconductor industry and as a result has a wide range of advanced test equipment, including automated solutions, to cater for the specialized techniques required for the testing of semiconductors.
The Nordson DAGE XD7600NT100CT is the ultimate system for non-destructive semiconductor inspection. With its ability to see features of 100 nanometres combined with fast and high resolution CT, it is regarded as the industry standard for this application. No other inspection system, readily available, has the ability to see features this small. This means that filled vias and other minute features are easily visible to the operator.