Nordson DAGE Wins EM Asia Innovation Award and SMT China Vision Award for the XD7600NT100HP X-ray Inspection system

More awards for the most technologically advanced system on the market

27 Apr 2010

Aylesbury, Buckinghamshire, UK – 27 April 2010 - Nordson DAGE, a subsidiary of Nordson Corporation (NASDAQ: NDSN) and the industry leader X-ray inspection technology, is delighted to announce that they have been further recognized by their peers by being awarded both the EM Asia Innovation Award and the SMT China Vision Award at ceremonies held in Shanghai during the Nepcon China 2010 exhibition for their revolutionary XD7600NT100HP X-ray inspection system.

Steve Kew, CEO of Nordson Dage said “Once again the strength of what we offer to the market has been acknowledged by the industry. This accomplishment reaffirms our continuing commitment to research and development even through the most recent challenging times for our industry.”

June Tan, Publisher of EM Asia said "We will continue to evolve and remain relevant to provide industry players with a driving force that truly recognizes excellent performance. All our winners have made major contributions towards their respective fields, and we are proud to honor their achievements,"

Adonis Mak, Publishing Director of SMT China magazine and President of ACT International Media Group said "The rapid development of China electronic manufacturing industry has drawn the world's attention.  Inevitably, international and domestic SMT equipments, materials and services providers have made tremendous contributions to the growth of the industry. He added “During the world economy crisis, many companies continued to invest in R&D to ensure that innovation and value be created for the market, and bring to the end-users in China new technologies and new products. This is what we have witnessed in the fourth SMT China Vision Awards Presentation Ceremony."

The multi-award winning XD7600NT100HP is the most technologically advanced X-ray inspection system on the market today with groundbreaking 100 nanometer (0.1 micron) feature recognition for finite analysis of the most challenging inspection applications.  Equipped with a 2.0M pixel XiDAT3 digital imaging system, the XD7600NT100HP offers oblique angle viewing of up to 70-degrees around any point of a 16”x18” (407x458mm) inspection area without compromising magnification.