Nordson DAGE Win Two 2012 Global Technology Awards

Nordson DAGE’s New X-Plane™ Technology wins its Third Industry Award in the Category of Software – Production. The XD7500VR Jade FP X-ray inspection system is named Best Asian Product

18 Oct 2012

 

Nordson DAGE, a division of Nordson Corporation (NASDAQ: NDSN), is delighted to announce that it has been awarded two Global Technology Awards at a ceremony that took place on Tuesday 16th October at the Walt Disney World Dolphin Hotel in Orlando, FL during the 2012 SMTA International Conference.

Nordson DAGE’s New X-Plane™ Technology won its third Industry Award in the category of
Software – Production and the XD7500VR Jade FP X-ray inspection system was named Best Asian Product.

X-Plane™ is a revolutionary option for Nordson DAGE’s range of industry-leading X-ray inspection systems that uses a proprietary, patent applied for tomosynthesis, or CT technique, to create 2-D X-ray slices in any plane of a printed circuit board assembly, without the need to cut or destroy the board. In this way, the superior image quality that Nordson DAGE X-ray systems always provide can now be extended into separating individual layers at a level of excellence that the traditional laminography technique cannot achieve. X-Plane™ technology is quick, simple and easy-to-use.

The Nordson DAGE XD7500VR Jade FP uses the latest technology flat panel detector to provide the market-leading, cost effective approach where high quality real-time imaging is needed for production tasks. This outstanding system utilizes its superior Flat Panel detector to quickly capture images with low noise at high gray scale depth resulting in crisper, faster imaging so providing the production operator with optimum throughput for decisions on acceptable product quality.